Associate Prof. Toru Nakura, Naoki Terao (M2), Associate Prof. Tetsuya Iizuka, Prof. Kunihiro Asada received Best Paper Award at the IEEE International Test Conference
On 31st December 2017, Associate Professor Toru Nakura, Mr. Naoki Terao, Major MSc student, Associate Professor Tetsuya Iizuka, Professor Kunihiro Asada, Department of Electrical Engineering and Information Systems, received Best Paper Award at the IEEE International Test Conference.
<About awarded research>
This research enables precise judgement of correct/defective devices on Automotive LSI Testing.
It is our great pleasure to receive such an honorable award.